Success: Your bookmark has been successfully created.
Success: Your bookmark has been successfully removed.
Success: Password updated and now signed in
Success: Your password has been updated

Available to following accounts

GC-MS data acquisition is carried out using full scan or selected ion monitoring (SIM) mode. Scan mode is used to cover a wide range of m/z ratios, whereas, SIM is used to gather data for specific masses of interest. This module will explain the differences between the data generated, provide you with details on the parameters which can be set to acquire the data, and the impact of the acquisition mode and parameters on the sensitivity of that data.


Topics include:

  • GC-MS acquisition modes introduction
  • Selection ion monitoring (SIM)
  • Scan
  • SIM/scan and effect on sensitivity